Semiconductor Electrostatic Discharge (ESD) Sensitivity Test:  Sensitivity of semiconductors to ESD type electrical overstress (EOS) pulses can be researched by applying varying voltages and current models to terminals of components.

Semiconductor ESD Sensitivity Test Equipment

Hermetic Evaluation:  The integrity of a component package is evaluated by immersing the device under test in a heated liquid Gross Leakage Test and observing bubbles; or, by immersing in a fluorescent dye (Zyglo) under a vacuum and observing the penetration.  In the photo below, the bright green area is where fluorescent dye (Zyglo) has penetrated into the component package and indicates an increased risk of ingress of contamination and resulting component failure.

Post Zyglo Dye Penetration Test – UV Lighting Glowing Green Area Indicates Dye Penetration